发明授权
- 专利标题: Automatic quantification of asymmetry
- 专利标题(中): 自动量化不对称性
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申请号: US13977025申请日: 2012-01-03
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公开(公告)号: US09123101B2公开(公告)日: 2015-09-01
- 发明人: Frank Olaf Thiele
- 申请人: Frank Olaf Thiele
- 申请人地址: NL Eindhoven
- 专利权人: Koninklijke Philips N.V.
- 当前专利权人: Koninklijke Philips N.V.
- 当前专利权人地址: NL Eindhoven
- 国际申请: PCT/IB2012/050025 WO 20120103
- 国际公布: WO2012/093353 WO 20120712
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T7/00 ; G06T7/60 ; A61B5/00
摘要:
An apparatus detects asymmetry in an object, such as a brain. The apparatus includes a processor programmed to fit a three-dimensional image of the object to a preselected shape, such as a standard brain atlas. The processor projects the three-dimensional image of the object to a two-dimensional surface image. The processor compares corresponding mirror image symmetric voxel pairs on the left and right sides of the surface image. The processor generates at least one of an asymmetry map and an asymmetry index based on the deviations in the pixel pairs. The processor can also mask, before the comparison, pixels of the surface image which are asymmetric in a normal brain.
公开/授权文献
- US20130289395A1 AUTOMATIC QUANTIFICATION OF ASYMMETRY 公开/授权日:2013-10-31
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