Invention Grant
- Patent Title: Spectrometer and method of operating same
- Patent Title (中): 光谱仪及其操作方法
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Application No.: US14220313Application Date: 2014-03-20
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Publication No.: US09074930B2Publication Date: 2015-07-07
- Inventor: Jurgen Kaufmann , Thomas Beyer , Julian Edler
- Applicant: SICK AG
- Applicant Address: DE Waldkirch
- Assignee: Sick AG
- Current Assignee: Sick AG
- Current Assignee Address: DE Waldkirch
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Stanley N. Protigal
- Priority: EP13162144 20130403
- Main IPC: G01J3/10
- IPC: G01J3/10 ; G01J1/42 ; G01J3/42 ; G01J3/02

Abstract:
A spectrometer has a first and second light sources (12, 14) which generate light radiation (24) in a first and second wavelength ranges, and a mirror unit (16) for deflecting the light radiation (24, 26) into a measurement path (18), arranged so that the radiation of both wavelength ranges (24, 26) runs through on the same optical path. A detector (20) detects radiation (24, 26) running through the measurement path (18) and an evaluation unit (22) evaluates the radiation (24, 26) incident at the detector (20) and for determining a concentration of a measurement gas component present in the measurement path (18). The mirror unit (16) is configured as a micromirror array (32) and that a single micromirror (34) only deflects a portion of the radiation (24, 26).
Public/Granted literature
- US20140299774A1 SPECTROMETER AND METHOD OF OPERATING SAME Public/Granted day:2014-10-09
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