Invention Grant
- Patent Title: Method of manufacturing semiconductor device and substrate processing apparatus
- Patent Title (中): 制造半导体器件和衬底处理设备的方法
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Application No.: US13553968Application Date: 2012-07-20
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Publication No.: US09039838B2Publication Date: 2015-05-26
- Inventor: Ryota Sasajima , Yoshiro Hirose , Yosuke Ota , Naonori Akae , Kojiro Yokozawa
- Applicant: Ryota Sasajima , Yoshiro Hirose , Yosuke Ota , Naonori Akae , Kojiro Yokozawa
- Applicant Address: JP Tokyo
- Assignee: Hitachi Kokusai Electric Inc.
- Current Assignee: Hitachi Kokusai Electric Inc.
- Current Assignee Address: JP Tokyo
- Agency: Volpe and Koenig, P.C.
- Priority: JP2009-265432 20091120; JP2010-215398 20100927
- Main IPC: C23C16/54
- IPC: C23C16/54 ; C23C16/56 ; H01L21/02 ; C23C16/40 ; C23C16/455 ; H01L21/314 ; H01L21/316

Abstract:
Provided is a substrate processing apparatus. The apparatus includes: a process vessel, a heater, a source gas supply system, an oxygen-containing gas supply system, a hydrogen-containing gas supply system, a pressure regulator, and a controller. The controller is configured to control the parts so as to perform: (a) forming an oxide film on a substrate by alternately repeating: (a-1) forming a layer by supplying a source gas into the process vessel accommodating the substrate; and (a-2) changing the layer into an oxide layer by supplying an oxygen-containing gas and an hydrogen-containing gas into the process vessel, the inside of the process vessel being under a heated atmosphere having a low pressure; and (b) modifying the oxide film formed on the substrate by supplying the oxygen-containing gas and the hydrogen-containing gas into the process vessel, the inside of the process vessel being under the heated atmosphere having the low pressure.
Public/Granted literature
- US20130019804A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS Public/Granted day:2013-01-24
Information query
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