发明授权
- 专利标题： Memory test method, memory test device, and adapter thereof
- 专利标题（中）： 内存测试方法，内存测试设备及其适配器
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申请号： US13911629申请日： 2013-06-06
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公开(公告)号： US09032262B2公开(公告)日： 2015-05-12
- 发明人: Ding-Shiuan Ho , Fu-Nen Lo
- 申请人： Wistron Corporation
- 申请人地址： TW New Taipei
- 专利权人： Wistron Corporation
- 当前专利权人： Wistron Corporation
- 当前专利权人地址： TW New Taipei
- 代理机构： Muncy, Geissler, Olds & Lowe, P.C.
- 优先权： TW101129571A 20120815
- 主分类号： G11C29/00
- IPC分类号： G11C29/00 ; G11C29/08 ; G11C29/56 ; G11C5/04
摘要：
A memory test device used to test performance of at least one memory module on an electronic device, are provided. The memory test device includes at least one adapter and a control unit. The adapter includes a plugging portion, a slot, and a switch circuit. The plugging portion is used to be plugged in a memory module slot of the electronic device. The slot is connected electrically to the plugging portion, is used for the memory module to plug in, and is capable of outputting a work voltage to the memory module when the adapter is plugged in the memory module slot and connected electrically to it. The switch circuit is connected electrically to the plugging portion and the slot. The control unit is connected electrically to the switch circuit of each adapter, where the control unit enables or disables the plugged memory module by controlling the switch circuit.
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