发明授权
US09031197B2 Method for detecting the true coincidence of two charge pulses on adjacent picture elements, X-ray detector and X-ray image recording apparatus
有权
用于检测相邻像素上的两个充电脉冲的真实重合的方法,X射线检测器和X射线图像记录装置
- 专利标题: Method for detecting the true coincidence of two charge pulses on adjacent picture elements, X-ray detector and X-ray image recording apparatus
- 专利标题(中): 用于检测相邻像素上的两个充电脉冲的真实重合的方法,X射线检测器和X射线图像记录装置
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申请号: US13562236申请日: 2012-07-30
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公开(公告)号: US09031197B2公开(公告)日: 2015-05-12
- 发明人: Martin Spahn
- 申请人: Martin Spahn
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE Munich
- 代理机构: King & Spalding L.L.P.
- 优先权: DE102011080077 20110729
- 主分类号: G01T1/172
- IPC分类号: G01T1/172 ; G01T1/24 ; G01N23/04 ; H04N5/32 ; G01T1/20 ; G01T1/29
摘要:
With the aid of discriminators on a picture element of an X-ray detector, digital outputs are generated that indicate energy intervals to which X-ray quanta are allocated. If this occurs for adjacent picture elements, a distinction may be made between true coincidences, in which k-fluorescence photons play a part, and random coincidences in which two primary quanta randomly strike adjacent picture elements. The energy of the primary quantum may also be at least roughly reconstructed in the case of true coincidences. An energy-triggering measurement may thereby be provided to the extent that different materials of a picture object should be distinguished.
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