发明授权
US09030301B2 Systems and methods to determine kinematical parameters using RFID tags
有权
使用RFID标签确定运动参数的系统和方法
- 专利标题： Systems and methods to determine kinematical parameters using RFID tags
- 专利标题（中）： 使用RFID标签确定运动参数的系统和方法
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申请号： US13891101申请日： 2013-05-09
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公开(公告)号： US09030301B2公开(公告)日： 2015-05-12
- 发明人: John R. Tuttle
- 申请人： Micron Technology, Inc.
- 申请人地址： US ID Boise
- 专利权人： Micron Technology, Inc.
- 当前专利权人： Micron Technology, Inc.
- 当前专利权人地址： US ID Boise
- 代理机构： Greenberg Traurig LLP
- 主分类号： H04Q5/22
- IPC分类号： H04Q5/22 ; G06K7/10 ; H04Q9/00
摘要：
Systems and methods to determine kinematical parameters of physical objects using radio frequency identification (RFID) tags attached to the objects. In one embodiment, one of a population of RFID tags is selectively instructed by an RFID reader to backscatter the interrogating electromagnetic wave and thus allow the RFID reader to measure the position, speed, acceleration, jerk of the object to which the tag is attached. The RFID reader combines the signal representing the backscattered interrogating electromagnetic wave and the signal representing the interrogating electromagnetic wave transmitted by the RFID reader to determine or monitor one or more of the kinematical parameters of the object.
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