发明授权
- 专利标题: Linear structure inspection apparatus and method
- 专利标题(中): 线性结构检查装置及方法
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申请号: US12520643申请日: 2007-12-20
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公开(公告)号: US09030195B2公开(公告)日: 2015-05-12
- 发明人: Paul D. Gies
- 申请人: Paul D. Gies
- 申请人地址: CA
- 专利权人: Athena Industrial Technologies, Inc.
- 当前专利权人: Athena Industrial Technologies, Inc.
- 当前专利权人地址: CA
- 代理机构: Ostrolenk Faber LLP
- 国际申请: PCT/CA2007/002359 WO 20071220
- 国际公布: WO2008/074161 WO 20080626
- 主分类号: G01N27/82
- IPC分类号: G01N27/82 ; G01N27/90 ; F16L101/30
摘要:
An apparatus is provided for sensing anomalies in a long electrically conductive object to be inspected. The object may be a pipeline, or other hollow tube. The apparatus may have a magnetic field generator, and an array of sensors spaced about the field generator. As relative motion in the longitudinal direction occurs between the apparatus and the object to be inspected, the moving magnetic field, or flux, passed from the field generator into the object to be inspected may tend to cause eddy currents to flow in the object. The sensors may be spaced both axially and circumferentially to permit variation in magnetic flux, or eddy current divergence, to be sensed as a function of either or both of axial position relative to the wave front of the magnetic field (or, effectively equivalently any other known datum such as the radial plane of the midpoint of the field generator), and circumferential position about the periphery of the apparatus as measured from an angular datum. Post processing calculation may then tend to permit inferences to be drawn about the location, size, size, shape, and perhaps nature, of anomalies in the object. The sensors, and possibly the entire field generator, may be maintained at a standoff distance from the object to be inspected, as by a sealed housing such as may protect the sensors and reduce the need for and cost of maintenance. The field generator may include two primary poles of like nature held in a non-touching back to back orientation, and may include secondary magnetic circuits placed to bias the flux of the primary magnetic circuit into a more focussed shape with respect to the object to be inspected.
公开/授权文献
- US20120038354A1 LINEAR STRUCTURE INSPECTION APPARATUS AND METHOD 公开/授权日:2012-02-16
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