Invention Grant
- Patent Title: BASE-T common mode testing in an Ethernet subsystem
- Patent Title (中): 以太网子系统中的BASE-T共模测试
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Application No.: US13755870Application Date: 2013-01-31
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Publication No.: US09014248B2Publication Date: 2015-04-21
- Inventor: Wael William Diab , William Bliss
- Applicant: Broadcom Corporation
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Agency: Sterne, Kessler, Goldstein & Fox PLLC
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04L25/02 ; H04B3/30 ; H04B3/46

Abstract:
Systems and methods are provided for common mode testing for a system using an Ethernet subsystem. The Ethernet subsystem generates test signals that can be introduced at various points in the system to detect the effect of noise introduced by various elements of the system. By introducing test signals at various points in a system, common mode noise introduced into the system can be more accurately determined.
Public/Granted literature
- US20140211832A1 Base-T Common Mode Testing in an Ethernet Subsystem Public/Granted day:2014-07-31
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