发明授权
US08993975B2 Gamma ray detecting apparatus and method for detecting gamma ray using the same
有权
γ射线检测装置及使用其的γ射线检测方法
- 专利标题: Gamma ray detecting apparatus and method for detecting gamma ray using the same
- 专利标题(中): γ射线检测装置及使用其的γ射线检测方法
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申请号: US14111103申请日: 2012-02-02
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公开(公告)号: US08993975B2公开(公告)日: 2015-03-31
- 发明人: Chan-Hyeong Kim , Jin-Hyung Park , Hee Seo
- 申请人: Chan-Hyeong Kim , Jin-Hyung Park , Hee Seo
- 申请人地址: KR Seoul
- 专利权人: Industry-University Cooperation Foundation Hanyang University
- 当前专利权人: Industry-University Cooperation Foundation Hanyang University
- 当前专利权人地址: KR Seoul
- 代理机构: Ladas & Parry LLP
- 优先权: KR10-2011-0033085 20110411
- 国际申请: PCT/KR2012/000809 WO 20120202
- 国际公布: WO2012/141420 WO 20121018
- 主分类号: G01T1/20
- IPC分类号: G01T1/20 ; G01T1/28 ; G01T1/29 ; A61B6/03 ; A61B6/00
摘要:
There are provided a gamma ray detecting apparatus, including: a secondary electron emitter causing a Compton scattering reaction with an incident gamma ray to emit secondary electrons in a progress direction of the gamma ray; a first radiation detector provided to be opposed to the secondary electron emitter with respect to an emission progress direction of the secondary electrons and detecting the position and transfer energy of the secondary electron; a second radiation detector provided to be opposed to the first radiation detector with respect to the emission progress direction of the secondary electron and detecting the position and the transfer energy of the secondary electron passing through the first radiation detector; a third radiation detector provided to be opposed to the second radiation detector with respect to the emission progress direction of the secondary electron and detecting residual energy of the secondary electron by absorbing the secondary electron passing through the second radiation detector; and a data processor having a coincidence circuit judging whether the secondary electrons simultaneously react in the first to third radiation detectors, and the data processor back traces trajectories of the secondary electrons detected by the first and second radiation detectors to detect the position of a ray source of the gamma ray, and a gamma ray detecting method.
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