Invention Grant
- Patent Title: Charged particle beam apparatus, and article manufacturing method
- Patent Title (中): 带电粒子束装置和制品制造方法
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Application No.: US13771388Application Date: 2013-02-20
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Publication No.: US08981323B2Publication Date: 2015-03-17
- Inventor: Ichiro Tanaka , Akira Miyake
- Applicant: Canon Kabushiki Kaisha
- Applicant Address: JP
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2012-034066 20120220
- Main IPC: G21K5/04
- IPC: G21K5/04 ; H01J37/317 ; H01J37/02

Abstract:
A charged particle beam apparatus for processing an object using a charged particle beam includes a charged particle lens in which an array of apertures, through each of which a charged particle beam passes, is formed; a vacuum container which contains the charged particle lens; and a radiation source configured to generate an ionizing radiation; wherein the apparatus is configured to cause the radiation source to pass the ionizing radiation through the array of apertures in a state in which a pressure in the vacuum container is changing.
Public/Granted literature
- US20130216959A1 CHARGED PARTICLE BEAM APPARATUS, AND ARTICLE MANUFACTURING METHOD Public/Granted day:2013-08-22
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