发明授权
- 专利标题: Obtaining debug information from a flash memory device
- 专利标题(中): 从闪存设备获取调试信息
-
申请号: US13032541申请日: 2011-02-22
-
公开(公告)号: US08966319B2公开(公告)日: 2015-02-24
- 发明人: Anthony Fai , Nir Jacob Wakrat , Nicholas Seroff
- 申请人: Anthony Fai , Nir Jacob Wakrat , Nicholas Seroff
- 申请人地址: US CA Cupertino
- 专利权人: Apple Inc.
- 当前专利权人: Apple Inc.
- 当前专利权人地址: US CA Cupertino
- 代理机构: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- 代理商 Stephen J. Curran
- 主分类号: G06F11/00
- IPC分类号: G06F11/00 ; G06F11/36
摘要:
This document generally describes systems, devices, methods, and techniques for obtaining debug information from a memory device. Debug information can include a variety of information associated with a memory device that can be used for debugging the device, such as a sequence of operations performed by the memory device and information regarding errors that have occurred (e.g., type of error, component of memory device associated with error). A memory device can be instructed by a host to obtain and provide debug information to the host. A memory device can be configured to obtain particular debug information using a variety of features, such as triggers. For instance, a memory device can use a trigger to collect debug information related to failed erase operations.
公开/授权文献
- US20120216079A1 Obtaining Debug Information from a Flash Memory Device 公开/授权日:2012-08-23
信息查询