发明授权
- 专利标题： Near-field millimeter wave imaging
- 专利标题（中）： 近场毫米波成像
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申请号： US13600930申请日： 2012-08-31
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公开(公告)号： US08957810B2公开(公告)日： 2015-02-17
- 发明人: Aydin Babakhani , Duixian Liu , Scott K. Reynolds , Mihai A. Sanduleanu
- 申请人： Aydin Babakhani , Duixian Liu , Scott K. Reynolds , Mihai A. Sanduleanu
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理机构： Ryan, Mason & Lewis, LLP
- 代理商 Anne V. Dougherty
- 主分类号： G01S13/89
- IPC分类号： G01S13/89 ; H01Q1/22 ; H01Q7/00 ; H01Q21/06
摘要：
Systems and method for near-field millimeter wave imaging are provided, in particular, near-field millimeter wave imaging systems and methods that enable sub-wavelength resolution imaging by scanning objects with sub-wavelength probe elements and capturing and measuring phase and intensity of reflected energy to generate images.
公开/授权文献
- US20130027244A1 NEAR-FIELD MILLIMETER WAVE IMAGING 公开/授权日：2013-01-31
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