Invention Grant
- Patent Title: Measure-based delay circuit
- Patent Title (中): 基于测量的延迟电路
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Application No.: US13831201Application Date: 2013-03-14
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Publication No.: US08957714B2Publication Date: 2015-02-17
- Inventor: Vaishnav Srinivas , Jan Christian Diffenderfer , Philip Michael Clovis , David Ian West
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Haynes and Boone, LLP
- Main IPC: H03L7/00
- IPC: H03L7/00 ; H03K5/159
Abstract:
A master measure circuit is disclosed that may select from various nodes on a delay path carrying a signal. The master measure circuit measures the delay for propagation of the signal from one selected node to another selected node and controls an adjustable delay circuit in the delay path accordingly.
Public/Granted literature
- US20140266357A1 Measure-Based Delay Circuit Public/Granted day:2014-09-18
Information query
