Invention Grant
- Patent Title: Incoherent transmission electron microscopy
- Patent Title (中): 不相干透射电子显微镜
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Application No.: US14258004Application Date: 2014-04-21
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Publication No.: US08921787B2Publication Date: 2014-12-30
- Inventor: Christopher Su-Yan Own , Andrew Bleloch , William Andregg
- Applicant: Christopher Su-Yan Own , William Andregg , Mochii, Inc.
- Applicant Address: US WA Seattle
- Assignee: Mochii, Inc.
- Current Assignee: Mochii, Inc.
- Current Assignee Address: US WA Seattle
- Agency: Mei & Mark LLP
- Main IPC: G01N23/02
- IPC: G01N23/02 ; G01N13/12 ; H01J37/26

Abstract:
A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio. Alternatively or in addition, the transmission electron microscope may be adapted to operate the specimen holder to move the specimen in relation to the beam optics during exposure or between exposures to operate the transmission electron microscope in an incoherent mode.
Public/Granted literature
- US20140284475A1 INCOHERENT TRANSMISSION ELECTRON MICROSCOPY Public/Granted day:2014-09-25
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