- 专利标题: Creation of vias and trenches with different depths
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申请号: US13407933申请日: 2012-02-29
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公开(公告)号: US08907458B2公开(公告)日: 2014-12-09
- 发明人: Shom Ponoth , David V. Horak , Takeshi Nogami , Chih-Chao Yang
- 申请人: Shom Ponoth , David V. Horak , Takeshi Nogami , Chih-Chao Yang
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理商 Yuanmin Cai
- 主分类号: H01L21/768
- IPC分类号: H01L21/768 ; H01L23/522 ; H01L23/532 ; H01L21/311
摘要:
Embodiments of the invention provide a method of creating vias and trenches with different length. The method includes depositing a plurality of dielectric layers on top of a semiconductor structure with the plurality of dielectric layers being separated by at least one etch-stop layer; creating multiple openings from a top surface of the plurality of dielectric layers down into the plurality of dielectric layers by a non-selective etching process, wherein at least one of the multiple openings has a depth below the etch-step layer; and continuing etching the multiple openings by a selective etching process until one or more openings of the multiple openings that are above the etch-stop layer reach and expose the etch-stop layer. Semiconductor structures made thereby are also provided.
公开/授权文献
- US20120153503A1 CREATION OF VIAS AND TRENCHES WITH DIFFERENT DEPTHS 公开/授权日:2012-06-21
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