发明授权
- 专利标题: Re-sampling S-parameters for serial data link analysis
- 专利标题(中): 重新采样S参数进行串行数据链路分析
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申请号: US13531917申请日: 2012-06-25
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公开(公告)号: US08891603B2公开(公告)日: 2014-11-18
- 发明人: Kan Tan , John J. Pickerd
- 申请人: Kan Tan , John J. Pickerd
- 申请人地址: US OR Beaverton
- 专利权人: Tektronix, Inc.
- 当前专利权人: Tektronix, Inc.
- 当前专利权人地址: US OR Beaverton
- 代理机构: Meagher Emanuel Laks Roehling & Goldberg, LLP
- 代理商 Thomas F. Lenihan
- 主分类号: H04B3/46
- IPC分类号: H04B3/46 ; H04B17/00 ; H04Q1/20
摘要:
A device and method of re-sampling a plurality of S-parameters for serial data link analysis is disclosed. The method includes storing a plurality of S-parameters sets, each S-parameter set being associated with a subsystem and having associated impulse responses and a time interval. An increased time interval is determined based on the time interval associated with each S-parameter set. The impulse responses are zero filled in each S-parameter set to maintain any wrapped ripples and increase the time interval. A plurality of resampled S-parameter sets are generated with a finer frequency resolution to cover the increased time interval.
公开/授权文献
- US20130343442A1 RE-SAMPLING S-PARAMETERS FOR SERIAL DATA LINK ANALYSIS 公开/授权日:2013-12-26
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