Invention Grant
- Patent Title: Automatic testing apparatus
- Patent Title (中): 自动检测仪器
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Application No.: US13242475Application Date: 2011-09-23
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Publication No.: US08880947B2Publication Date: 2014-11-04
- Inventor: Lei Tian , Chuan-Guo Zhang , Bin Zhi , Shi-Ping Wu
- Applicant: Lei Tian , Chuan-Guo Zhang , Bin Zhi , Shi-Ping Wu
- Applicant Address: TW Taipei Hsien
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW Taipei Hsien
- Agency: Rosenberg, Klein & Lee
- Priority: CN20111095024 20110415
- Main IPC: G06F11/273
- IPC: G06F11/273

Abstract:
The present invention relates to an automatic testing apparatus used for testing a tested device. The automatic testing apparatus is fixed on a first side of a testing platform. The tested device executes a testing program while being tested, and transmits a test signal to a control unit of the testing platform for controlling a driving testing unit or a multimedia testing module to test the tested device and hence testing the tested device automatically. Thereby, testing costs can be saved and artificial factor affecting the test results can be avoided.
Public/Granted literature
- US20120266021A1 AUTOMATIC TESTING APPARATUS Public/Granted day:2012-10-18
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