发明授权
- 专利标题： Automatic testing apparatus
- 专利标题（中）： 自动检测仪器
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申请号： US13242475申请日： 2011-09-23
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公开(公告)号： US08880947B2公开(公告)日： 2014-11-04
- 发明人: Lei Tian , Chuan-Guo Zhang , Bin Zhi , Shi-Ping Wu
- 申请人： Lei Tian , Chuan-Guo Zhang , Bin Zhi , Shi-Ping Wu
- 申请人地址： TW Taipei Hsien
- 专利权人： Wistron Corporation
- 当前专利权人： Wistron Corporation
- 当前专利权人地址： TW Taipei Hsien
- 代理机构： Rosenberg, Klein & Lee
- 优先权： CN20111095024 20110415
- 主分类号： G06F11/273
- IPC分类号： G06F11/273
摘要：
The present invention relates to an automatic testing apparatus used for testing a tested device. The automatic testing apparatus is fixed on a first side of a testing platform. The tested device executes a testing program while being tested, and transmits a test signal to a control unit of the testing platform for controlling a driving testing unit or a multimedia testing module to test the tested device and hence testing the tested device automatically. Thereby, testing costs can be saved and artificial factor affecting the test results can be avoided.
公开/授权文献
- US20120266021A1 AUTOMATIC TESTING APPARATUS 公开/授权日：2012-10-18
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