Imaging device analysis systems and imaging device analysis methods are described. According to one embodiment, an imaging device analysis system includes a light source configured to generate a plurality of light beams for analysis of an imaging device, wherein the light beams comprise light of a plurality of different spectral power distributions, processing circuitry coupled with the light source and configured to control the light source to generate the light beams, and an optical interface optically coupled with a light receiving member of the imaging device and configured to communicate the plurality of light beams to the light receiving member of the imaging device.