发明授权
- 专利标题: Sample measuring device and sample measuring system
- 专利标题(中): 样品测量装置和样品测量系统
-
申请号: US13458694申请日: 2012-04-27
-
公开(公告)号: US08854206B2公开(公告)日: 2014-10-07
- 发明人: Akinori Kai , Atsushi Wada
- 申请人: Akinori Kai , Atsushi Wada
- 申请人地址: JP Kyoto
- 专利权人: ARKRAY, Inc.
- 当前专利权人: ARKRAY, Inc.
- 当前专利权人地址: JP Kyoto
- 代理机构: Studebaker & Brackett PC
- 优先权: JP2011-100409 20110428
- 主分类号: G08B1/08
- IPC分类号: G08B1/08 ; A61B5/00 ; A61B5/145
摘要:
A sample measuring device according to the present invention includes a measuring unit for performing measurement with respect to a particular component contained in a sample, a measurement data storage unit for storing measurement data obtained by the measuring unit, a display unit for displaying the measurement data, a sensor strip detector for detecting insertion and removal of a sensor strip to which the sample is applied, and a first data transmitter/receiver for transmitting the measurement data via wireless communication. The first data transmitter/receiver performs initial authentication process for wireless communication after insertion of the sensor strip is detected by the sensor strip detector.
公开/授权文献
- US20120274443A1 SAMPLE MEASURING DEVICE AND SAMPLE MEASURING SYSTEM 公开/授权日:2012-11-01
信息查询