发明授权
- 专利标题: Composition for forming silicon-containing film, silicon-containing film-formed substrate and patterning process
- 专利标题(中): 用于形成含硅膜,含硅膜形成基板和图案化工艺的组合物
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申请号: US12461374申请日: 2009-08-10
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公开(公告)号: US08852844B2公开(公告)日: 2014-10-07
- 发明人: Tsutomu Ogihara , Takafumi Ueda , Toshiharu Yano
- 申请人: Tsutomu Ogihara , Takafumi Ueda , Toshiharu Yano
- 申请人地址: JP Tokyo
- 专利权人: Shin-Etsu Chemical Co., Ltd.
- 当前专利权人: Shin-Etsu Chemical Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff PLC
- 优先权: JP2008-257422 20081002
- 主分类号: G03F7/00
- IPC分类号: G03F7/00 ; G03F7/004 ; C08G77/06
摘要:
There is disclosed a thermosetting composition for forming a silicon-containing film to form a silicon-containing film formed in a multilayer resist process used in lithography, including at least (A) a silicon-containing compound obtained by hydrolyzing and condensing a hydrolyzable silicon compound using an acid as a catalyst, (B) a thermal crosslinking accelerator (C) a monovalent or bivalent or more organic acid having 1 to 30 carbon atoms, (D) trivalent or more alcohol and (E) an organic solvent. There can be provided a composition for a silicon-containing film which can form a good pattern in a photoresist film, can form a silicon-containing film for an etching mask having a good dry etching resistance, can give a good storage stability and can be delaminated with a solution used in a delamination process in a multilayer resist process used for lithography, a substrate on which the silicon-containing film is formed, and further a method for forming a pattern.
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