发明授权
- 专利标题: Flow type particle image analysis method and device
- 专利标题(中): 流式粒子图像分析方法及装置
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申请号: US13375249申请日: 2010-05-17
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公开(公告)号: US08831306B2公开(公告)日: 2014-09-09
- 发明人: Chihiro Manri , Norio Oowada , Satoshi Mitsuyama
- 申请人: Chihiro Manri , Norio Oowada , Satoshi Mitsuyama
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2009-134212 20090603
- 国际申请: PCT/JP2010/058261 WO 20100517
- 国际公布: WO2010/140460 WO 20101209
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06K9/40 ; G01N15/14
摘要:
At each of mutually different multiple focal positions, focal adjustment parameter values are obtained from images of standard particles made of the same substance. Each focal adjustment parameter value is figured out as any one of the ratio between the density value around the center of the standard particle image and the density value around the outline, the difference therebetween, and the density value around the center. The in-focus position is adjusted on the basis of the relationship between the obtained focal adjustment parameter values and the focal positions. Moreover, on the basis of the relationship between the focal adjustment parameter values and the focal positions, the parameter values are converted into focal positions, and the focal positions and dispersion thereof are used to check the displacement of the in-focus position and the thickness of the sample liquid.
公开/授权文献
- US20120076349A1 FLOW TYPE PARTICLE IMAGE ANALYSIS METHOD AND DEVICE 公开/授权日:2012-03-29
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