发明授权
US08808961B2 Composition, resist film, pattern forming method, and inkjet recording method 有权
组合物,抗蚀剂膜,图案形成方法和喷墨记录方法

Composition, resist film, pattern forming method, and inkjet recording method
摘要:
An embodiment of the composition contains any of compounds of the formula A-LG in which A represents any of residues of general formula (A-1) below and LG represents any of groups that are cleaved to generate acids of the formula A-H when acted on by an acid. The composition further contains at least one of a compound that generates an acid when exposed to actinic rays or radiation and a compound that generates an acid when heated.
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