In accordance with various aspects of the disclosure, a method, system, and computer readable media having instructions for processing images is disclosed. For example, the method includes determining a suspicious pixel suspected of causing an artifact in a measurement as a function of a statistical analysis of a collection of samples representing residual error values associated with a subject focal plane pixel measuring one waveband at different times. Based on the determination of the suspicious pixel, a pattern of residual error values is identified that is indicative of the artifact caused by the suspicious pixel. A correcting time-dependent offset determined that is substantially reciprocal to the identified pattern of residual error values. The correcting time-dependent offset is applied to the measurement to correct for artifact in the measurement.