发明授权
US08792705B2 System and method for automated defect detection utilizing prior data
有权
使用先前数据进行自动化缺陷检测的系统和方法
- 专利标题： System and method for automated defect detection utilizing prior data
- 专利标题（中）： 使用先前数据进行自动化缺陷检测的系统和方法
-
申请号： US13288576申请日： 2011-11-03
-
公开(公告)号： US08792705B2公开(公告)日： 2014-07-29
- 发明人: Paul Raymond Scheid , Richard C. Grant , Alan Matthew Finn , Hongcheng Wang , Ziyou Xiong
- 申请人： Paul Raymond Scheid , Richard C. Grant , Alan Matthew Finn , Hongcheng Wang , Ziyou Xiong
- 申请人地址： US CT Hartford
- 专利权人： United Technologies Corporation
- 当前专利权人： United Technologies Corporation
- 当前专利权人地址： US CT Hartford
- 代理机构： Miller, Matthias & Hull LLP
- 主分类号： G06K9/00
- IPC分类号： G06K9/00
摘要：
A system and method for performing automated defect detection by utilizing data from prior inspections is disclosed. The system and method may include providing a image capture device for capturing and transmitting at least one current image of an object and providing a database for storing at least one prior image from prior inspections. The system and method may further include registering the at least one current image with the at least one prior image, comparing the registered at least one current image with the at least one prior image to determine a transformation therebetween and updating the database with the at least one current image.
公开/授权文献
信息查询
