Invention Grant
- Patent Title: Measurement of liquid fraction dropout using micropatterned surfaces
- Patent Title (中): 使用微图案表面测量液体馏分
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Application No.: US13277933Application Date: 2011-10-20
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Publication No.: US08786860B2Publication Date: 2014-07-22
- Inventor: Christopher Harrison , Robert J. Schroeder , Matthew T. Sullivan , Bradley Martin , Albert Ballard Andrews , Oliver Clinton Mullins
- Applicant: Christopher Harrison , Robert J. Schroeder , Matthew T. Sullivan , Bradley Martin , Albert Ballard Andrews , Oliver Clinton Mullins
- Applicant Address: US TX Sugar Land
- Assignee: Schlumberger Technology Corporation
- Current Assignee: Schlumberger Technology Corporation
- Current Assignee Address: US TX Sugar Land
- Agent Jakub M. Michna; Bridget Laffey
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N25/68

Abstract:
Accurate, real-time detection of dew point of a gaseous sample can be accomplished using the systems and techniques described herein. A gaseous sampling chamber defining an interior volume includes a patterned structure having a roughened surface exposed to the gaseous sampling chamber. The patterned structure includes an open volume accessible by the roughened surface, for example, representing at least about 10% of the interior volume of the gaseous sampling chamber. An illumination source is configured to illuminate at least a portion of the patterned structure. A light detector is configured to receive at least a portion of illumination returned from the patterned structure. A condensate detector is configured to determine a presence of a condensate on the roughened surface in response to an optical property of the patterned surface as modified by the presence of dew.
Public/Granted literature
- US20130100453A1 MEASUREMENT OF LIQUID FRACTION DROPOUT USING MICROPATTERNED SURFACES Public/Granted day:2013-04-25
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