发明授权
US08768037B2 Method for correcting image artifacts occuring as a result of an anti scatter grid
有权
用于校正作为反散射网格的结果发生的图像伪影的方法
- 专利标题: Method for correcting image artifacts occuring as a result of an anti scatter grid
- 专利标题(中): 用于校正作为反散射网格的结果发生的图像伪影的方法
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申请号: US13710727申请日: 2012-12-11
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公开(公告)号: US08768037B2公开(公告)日: 2014-07-01
- 发明人: Christian Kruschel , Christoph Köhler
- 申请人: Christian Kruschel , Christoph Köhler
- 申请人地址: DE München
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE München
- 优先权: DE102011088265 20111212
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
A method for correcting image artifacts is proposed. The artifacts occur as a result of an anti scatter grid connected rigidly to an x-ray detector in recording three-dimensional image datasets. Two-dimensional projection images of an object are recorded from different recording geometries for reconstruction the three-dimensional image dataset. A calibration image is recorded for each recording geometry. An average image from all recorded calibration images is established. Subtraction images are established by subtracting the average image from the corresponding calibration images. Noise is removed from the subtraction images. The subtraction images and the average image are stored. A correction image is established for each recording geometry by addition of the subtraction image assigned to the recording geometry and of the average image and is used for correcting the projection image.
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