发明授权
US08766630B2 Method and apparatus for monitoring a property of a sample 有权
用于监测样品性质的方法和装置

Method and apparatus for monitoring a property of a sample
摘要:
The present disclosure provides a method of monitoring a property of a sample, such as a nanoscopic property of the sample. The method comprises the steps of providing a quantum probe having a quantum state and exposing the quantum probe to the sample in a manner such that the property of the sample, in the proximity of the quantum probe, affects quantum coherence of the quantum probe. The method also comprises detecting a rate of quantum decoherence of the quantum probe to monitor the property of the sample. Further the present disclosure provides an apparatus for monitoring a property of a sample.
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