发明授权
- 专利标题: Scanning method for scanning a sample with a probe
- 专利标题(中): 用探头扫描样品的扫描方法
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申请号: US13655200申请日: 2012-10-18
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公开(公告)号: US08707461B2公开(公告)日: 2014-04-22
- 发明人: Arthur Reinout Hartong , Cornelis Sander Kooijman
- 申请人: FEI Company
- 申请人地址: US OR Hillsboro
- 专利权人: FEI Company
- 当前专利权人: FEI Company
- 当前专利权人地址: US OR Hillsboro
- 代理机构: Scheinberg & Associates, PC
- 代理商 Michael O. Scheinberg; Ki O
- 优先权: EP11185586 20111018
- 主分类号: G01Q30/06
- IPC分类号: G01Q30/06
摘要:
The method relates to a method of scanning a sample. Scanning a sample is typically done by scanning the sample with a probe along a multitude of parallel lines. In prior art scan methods a sample is scanned multiple times with a nominally identical scan pattern. The invention is based on the insight that the coherence between adjacent points in a direction along the scan direction is much better than the coherence of adjacent points perpendicular to the scan direction. By combining two images that are scanned perpendicular to each other, it should thus be possible to form an image making use of the improved coherence (due to shorter temporal distance) in both directions. The method thus involves scanning the sample with two scan patterns, the lines of one scan pattern preferably perpendicular to the lines of the other scan pattern. Hereby it is possible to use the temporal coherence of scan points on a line of one scan pattern to align the lines of the other scan pattern, and vice versa.
公开/授权文献
- US20130254948A1 Scanning Method for Scanning a Sample with a Probe 公开/授权日:2013-09-26
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