发明授权
US08705292B2 Nonvolatile memory circuit with an oxide semiconductor transistor for reducing power consumption and electronic device
有权
具有用于降低功耗的氧化物半导体晶体管的非易失性存储器电路和电子器件
- 专利标题: Nonvolatile memory circuit with an oxide semiconductor transistor for reducing power consumption and electronic device
- 专利标题(中): 具有用于降低功耗的氧化物半导体晶体管的非易失性存储器电路和电子器件
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申请号: US13466842申请日: 2012-05-08
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公开(公告)号: US08705292B2公开(公告)日: 2014-04-22
- 发明人: Masashi Fujita
- 申请人: Masashi Fujita
- 申请人地址: JP Atsugi-shi, Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Atsugi-shi, Kanagawa-ken
- 代理机构: Fish & Richardson P.C.
- 优先权: JP2011-107831 20110513
- 主分类号: G11C11/34
- IPC分类号: G11C11/34
摘要:
To provide a nonvolatile memory circuit having a novel structure. A first memory circuit, a second memory circuit, a first switch, a second switch, and a phase inverter circuit are included. The first memory circuit includes a first transistor formed using an oxide semiconductor film, a second transistor, a third transistor, and a capacitor. The first transistor formed using an oxide semiconductor film and the capacitor are used to form the nonvolatile memory circuit. Reductions in number of power supply lines and signal lines which are connected to the memory circuit and transistors used in the memory circuit allow a reduction in circuit scale of the nonvolatile memory circuit.
公开/授权文献
- US20120287702A1 MEMORY CIRCUIT AND ELECTRONIC DEVICE 公开/授权日:2012-11-15
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