发明授权
- 专利标题: Hyperspectral stimulated emission depletion microscopy and methods of use thereof
- 专利标题(中): 高光谱刺激发射耗尽显微镜及其使用方法
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申请号: US13609057申请日: 2012-09-10
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公开(公告)号: US08686363B1公开(公告)日: 2014-04-01
- 发明人: Jerilyn A. Timlin , Jesse S. Aaron
- 申请人: Jerilyn A. Timlin , Jesse S. Aaron
- 申请人地址: US NM Albuquerque
- 专利权人: Sandia Corporation
- 当前专利权人: Sandia Corporation
- 当前专利权人地址: US NM Albuquerque
- 代理商 Marcus S. Simon
- 主分类号: G01J5/02
- IPC分类号: G01J5/02
摘要:
A hyperspectral stimulated emission depletion (“STED”) microscope system for high-resolution imaging of samples labeled with multiple fluorophores (e.g., two to ten fluorophores). The hyperspectral STED microscope includes a light source, optical systems configured for generating an excitation light beam and a depletion light beam, optical systems configured for focusing the excitation and depletion light beams on a sample, and systems for collecting and processing data generated by interaction of the excitation and depletion light beams with the sample. Hyperspectral STED data may be analyzed using multivariate curve resolution analysis techniques to deconvolute emission from the multiple fluorophores. The hyperspectral STED microscope described herein can be used for multi-color, subdiffraction imaging of samples (e.g., materials and biological materials) and for analyzing a tissue by Förster Resonance Energy Transfer (“FRET”).
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