Invention Grant
- Patent Title: Circuit and method for measuring capacitance value of touch screen
- Patent Title (中): 用于测量触摸屏电容值的电路和方法
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Application No.: US13106411Application Date: 2011-05-12
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Publication No.: US08674709B2Publication Date: 2014-03-18
- Inventor: Ji Hun Kim , Hyun Min Song , Joon Ho Na , Ki Uk Gwak , Sang Gug Lee
- Applicant: Ji Hun Kim , Hyun Min Song , Joon Ho Na , Ki Uk Gwak , Sang Gug Lee
- Applicant Address: KR Daejeon-Si
- Assignee: Silicon Works Co., Ltd.
- Current Assignee: Silicon Works Co., Ltd.
- Current Assignee Address: KR Daejeon-Si
- Agency: Kile Park Reed & Houtteman PLLC
- Priority: KR10-2010-0044814 20100513
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A circuit for measuring a capacitance value of a touch screen includes: a target capacitor unit having a target capacitor charged with a target charging voltage; a target voltage control unit to charge the target capacitor; a reference capacitor unit having a reference capacitor charged with a charging reference voltage; a reference voltage control unit to charge the reference capacitor; a comparator to compare the target charging voltage and the charging reference voltage and output a transition signal at a moment when the target charging voltage becomes higher than the charging reference voltage; and a controller to receive an output signal of the comparator and a clock signal and generate a digital output signal and a control signal, wherein a capacitance value of the target capacitor is measured using a time elapsed from a time when the target capacitor is initialized to a time when the transition signal is outputted.
Public/Granted literature
- US20110279131A1 CIRCUIT AND METHOD FOR MEASURING CAPACITANCE VALUE OF TOUCH SCREEN Public/Granted day:2011-11-17
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