Invention Grant
- Patent Title: Method and apparatus for detecting objects
- Patent Title (中): 用于检测物体的方法和装置
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Application No.: US12078737Application Date: 2008-04-03
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Publication No.: US08666175B2Publication Date: 2014-03-04
- Inventor: Jung-bae Kim , Seong-deok Lee , Jong-ha Lee
- Applicant: Jung-bae Kim , Seong-deok Lee , Jong-ha Lee
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2007-0120357 20071123
- Main IPC: G06K9/62
- IPC: G06K9/62

Abstract:
A method and apparatus for detecting an object are provided. The method calculates a feature value based on features extracted from an input image by using a classifier of an ith stage, compares the calculated feature value with a first threshold value of the ith stage, compares the feature value with a second threshold value of the ith stage according to a result of the comparison between the feature value and the first threshold value of the ith stage, and jumps to a classifier of an i+2th stage according to a result of the comparison between the feature value and the second threshold value of the ith stage. By doing so, the method can avoid repeated calculations and can rapidly detect the object in the input image.
Public/Granted literature
- US20100284622A1 Method and apparatus for detecting objects Public/Granted day:2010-11-11
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