Invention Grant
US08659750B2 Test apparatus, test method, and device interface 有权
测试仪器,测试方法和设备接口

  • Patent Title: Test apparatus, test method, and device interface
  • Patent Title (中): 测试仪器,测试方法和设备接口
  • Application No.: US13040161
    Application Date: 2011-03-03
  • Publication No.: US08659750B2
    Publication Date: 2014-02-25
  • Inventor: Shin Masuda
  • Applicant: Shin Masuda
  • Applicant Address: JP Tokyo
  • Assignee: Advantest Corporation
  • Current Assignee: Advantest Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2010-113501 20100517
  • Main IPC: G01N21/00
  • IPC: G01N21/00
Test apparatus, test method, and device interface
Abstract:
Provided is a test apparatus that tests a device under test including an optical coupler for transmitting optical signals in a surface direction and a first groove for holding an optical transmission path connected to the optical coupler. The test apparatus comprises a substrate on which the device under test is to be loaded; an optical transmission path to be connected to the optical coupler; and a pressing section that presses the optical transmission path from the substrate side toward the first groove. Also provided is a test method.
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