Invention Grant
- Patent Title: Test apparatus, test method, and device interface
- Patent Title (中): 测试仪器,测试方法和设备接口
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Application No.: US13040161Application Date: 2011-03-03
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Publication No.: US08659750B2Publication Date: 2014-02-25
- Inventor: Shin Masuda
- Applicant: Shin Masuda
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2010-113501 20100517
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
Provided is a test apparatus that tests a device under test including an optical coupler for transmitting optical signals in a surface direction and a first groove for holding an optical transmission path connected to the optical coupler. The test apparatus comprises a substrate on which the device under test is to be loaded; an optical transmission path to be connected to the optical coupler; and a pressing section that presses the optical transmission path from the substrate side toward the first groove. Also provided is a test method.
Public/Granted literature
- US20110279811A1 TEST APPARATUS, TEST METHOD, AND DEVICE INTERFACE Public/Granted day:2011-11-17
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