Invention Grant
- Patent Title: Systems and methods for MS-MS-analysis
- Patent Title (中): 用于MS-MS分析的系统和方法
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Application No.: US13827685Application Date: 2013-03-14
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Publication No.: US08637816B1Publication Date: 2014-01-28
- Inventor: Alexander Mordehai , Kenneth R. Newton
- Applicant: Agilent Technologies, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: H01J3/00
- IPC: H01J3/00 ; H01J49/42 ; H01J49/26 ; B01D59/44

Abstract:
A mass spectrum is acquired by accumulating parent ions in an ion trap, ejecting parent ions of a selected m/z ratio into a collision cell, producing fragment ions from the parent ions, and analyzing the fragment ions in a mass analyzer. The other parent ions remain stored in the ion trap, and thus the process may be repeated by mass-selectively scanning parent ions from the ion trap. In this manner, the full mass range of parent ions or any desired subset of the full mass range may be analyzed without significant ion loss or undue time expenditure. The collision cell may provide a large ion acceptance aperture and relatively smaller ion emission aperture. The collision cell may pulse ions out to the mass analyzer. The mass analyzer may be a time-of-flight analyzer. The timing of pulsing of ions out from the collision cell may be matched with the timing of pulsing of ions into the time-of-flight analyzer.
Public/Granted literature
- US20140034827A1 SYSTEMS AND METHODS FOR MS-MS-ANALYSIS Public/Granted day:2014-02-06
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