发明授权
US08637336B2 Method for producing semiconductor wafer 有权
半导体晶片的制造方法

  • 专利标题: Method for producing semiconductor wafer
  • 专利标题(中): 半导体晶片的制造方法
  • 申请号: US13574186
    申请日: 2011-01-14
  • 公开(公告)号: US08637336B2
    公开(公告)日: 2014-01-28
  • 发明人: Susumu Sugano
  • 申请人: Susumu Sugano
  • 申请人地址: JP Aichi-ken
  • 专利权人: Toyoda Gosei Co., Ltd.
  • 当前专利权人: Toyoda Gosei Co., Ltd.
  • 当前专利权人地址: JP Aichi-ken
  • 代理机构: Sughrue Mion, PLLC
  • 优先权: JP2010-010500 20100120
  • 国际申请: PCT/JP2011/050533 WO 20110114
  • 国际公布: WO2011/089979 WO 20110728
  • 主分类号: H01L21/00
  • IPC分类号: H01L21/00
Method for producing semiconductor wafer
摘要:
A method of producing a semiconductor wafer, which includes: placing a wafer (10) provided with a substrate (11) and a semiconductor layer (20) formed thereon, on a carrier plate (fixing plate) (31) of a grinder via fixing wax (33a and 33b) such that the surface (10a) to be ground faces upward; heating the carrier plate to soften the fixing wax; pressure-contacting the wafer from the side of the surface (10a) to be ground using an air bag such that a portion of the softened fixing wax spreads and protrudes from the peripheral edge of the wafer; cooling the carrier plate while applying pressure to cure the fixing wax and fix the wafer onto the carrier plate; and rotating the surface (10a) to be ground of the fixed wafer while pressure-contacting the surface (10a) to the grinding plate of the grinder, thereby grinding the surface (10a) to be ground.
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