发明授权
- 专利标题: Method for producing semiconductor wafer
- 专利标题(中): 半导体晶片的制造方法
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申请号: US13574186申请日: 2011-01-14
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公开(公告)号: US08637336B2公开(公告)日: 2014-01-28
- 发明人: Susumu Sugano
- 申请人: Susumu Sugano
- 申请人地址: JP Aichi-ken
- 专利权人: Toyoda Gosei Co., Ltd.
- 当前专利权人: Toyoda Gosei Co., Ltd.
- 当前专利权人地址: JP Aichi-ken
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2010-010500 20100120
- 国际申请: PCT/JP2011/050533 WO 20110114
- 国际公布: WO2011/089979 WO 20110728
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
A method of producing a semiconductor wafer, which includes: placing a wafer (10) provided with a substrate (11) and a semiconductor layer (20) formed thereon, on a carrier plate (fixing plate) (31) of a grinder via fixing wax (33a and 33b) such that the surface (10a) to be ground faces upward; heating the carrier plate to soften the fixing wax; pressure-contacting the wafer from the side of the surface (10a) to be ground using an air bag such that a portion of the softened fixing wax spreads and protrudes from the peripheral edge of the wafer; cooling the carrier plate while applying pressure to cure the fixing wax and fix the wafer onto the carrier plate; and rotating the surface (10a) to be ground of the fixed wafer while pressure-contacting the surface (10a) to the grinding plate of the grinder, thereby grinding the surface (10a) to be ground.
公开/授权文献
- US20120295383A1 METHOD FOR PRODUCING SEMICONDUCTOR WAFER 公开/授权日:2012-11-22
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