发明授权
- 专利标题: Measuring T-Wave alternans
- 专利标题(中): 测量T波交替
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申请号: US12610062申请日: 2009-10-30
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公开(公告)号: US08634903B2公开(公告)日: 2014-01-21
- 发明人: Vinod Sharma , Xiaohong Zhou
- 申请人: Vinod Sharma , Xiaohong Zhou
- 申请人地址: US MN Minneapolis
- 专利权人: Medtronic, Inc.
- 当前专利权人: Medtronic, Inc.
- 当前专利权人地址: US MN Minneapolis
- 代理商 Michael C. Soldner
- 主分类号: A61B5/0468
- IPC分类号: A61B5/0468
摘要:
An implantable medical device (IMD), such as an implantable pacemaker, cardioverter, or diagnostic device, generates an EGM signal, e.g., a far field EGM signal, samples the EGM signal to obtain a single T-wave amplitude value for each T-wave over a plurality of beats, and stores the T-wave amplitude values in memory. The IMD creates a time series of the T-wave amplitude values stored in memory, calculates the power spectral density for the times series, and selects a power spectral density of a particular frequency, e.g., 0.5 cycles per beat, as the TWA value. The IMD may periodically determine TWA values for the patient and store the values in memory. The TWA values may be presented to medical personnel, e.g., as a trend. The IMD may deliver or modify therapy, or provide an alert, based on the TWA values.
公开/授权文献
- US20110105929A1 MEASURING T-WAVE ALTERNANS 公开/授权日:2011-05-05
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