发明授权
US08614796B2 Measuring station for high-gloss surfaces 有权
高光泽表面测量站

  • 专利标题: Measuring station for high-gloss surfaces
  • 专利标题(中): 高光泽表面测量站
  • 申请号: US12918162
    申请日: 2009-02-16
  • 公开(公告)号: US08614796B2
    公开(公告)日: 2013-12-24
  • 发明人: Ulrich Rattunde
  • 申请人: Ulrich Rattunde
  • 申请人地址: DE Ludwigslust
  • 专利权人: Rattunde & Co GmbH
  • 当前专利权人: Rattunde & Co GmbH
  • 当前专利权人地址: DE Ludwigslust
  • 代理机构: Varnum, Riddering, Schmidt & Howlett LLP
  • 优先权: DE102008009757 20080218
  • 国际申请: PCT/DE2009/000210 WO 20090216
  • 国际公布: WO2009/103272 WO 20090827
  • 主分类号: G01B11/30
  • IPC分类号: G01B11/30
Measuring station for high-gloss surfaces
摘要:
A method is disclosed for measuring a profile of a reflecting face of an end (2) of a pipe section. An electrical field is generated between the face and suspended particles (19) in the ambient air of the face. The particles (19) are attracted to the face by the electrical field and matt-finishing the face. The face is then sensed with a laser beam (16) and scattered light (17) is reflected by the face and measured by a sensor (11), thereby determining a face profile.
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