Invention Grant
- Patent Title: Charged particle beam apparatus
- Patent Title (中): 带电粒子束装置
-
Application No.: US13767822Application Date: 2013-02-14
-
Publication No.: US08581186B2Publication Date: 2013-11-12
- Inventor: Makoto Suzuki , Kazunari Asao
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2012-029057 20120214
- Main IPC: H01J37/256
- IPC: H01J37/256 ; H01J37/26

Abstract:
There is proposed a charged particle beam apparatus including: a plurality of noise removal filters that remove noise of an electrical signal; a measurement unit that measures the contrast-to-noise ratio after applying one of the noise removal filters; and a determination unit that determines a magnitude relationship between the contrast-to-noise ratio measured by the measurement unit and a threshold value set in advance.
Public/Granted literature
- US20130206986A1 CHARGED PARTICLE BEAM APPARATUS Public/Granted day:2013-08-15
Information query