Invention Grant
US08576988B2 Distributed X-ray source and X-ray imaging system comprising the same
失效
分布式X射线源和X射线成像系统由此构成
- Patent Title: Distributed X-ray source and X-ray imaging system comprising the same
- Patent Title (中): 分布式X射线源和X射线成像系统由此构成
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Application No.: US13393835Application Date: 2010-09-13
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Publication No.: US08576988B2Publication Date: 2013-11-05
- Inventor: Astrid Lewalter , Rainer Pietig , Wolfgang Chrost
- Applicant: Astrid Lewalter , Rainer Pietig , Wolfgang Chrost
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09170298 20090915
- International Application: PCT/IB2010/054113 WO 20100913
- International Announcement: WO2011/033439 WO 20110324
- Main IPC: H01J35/08
- IPC: H01J35/08 ; H01J35/28

Abstract:
A distributed X-ray source (3) and an imaging system (1) comprising such an X-ray source (3) are proposed. The X-ray source (3) comprises an electron beam source arrangement (19) and an anode arrangement (17). The electron beam source arrangement (19) is adapted to emit electron beams (24) towards at least two locally distinct focal spots (27) on the anode arrangement (17). Therein, the X-ray source is adapted for displacing the anode arrangement (17) with respect to the electron beam source arrangement (19). While the provision of a plurality of focal spots allows acquisition of projection images under different projection angles thereby allowing reconstruction of three-dimensional X-ray images e.g. in tomosynthesis application, a displacement motion of the anode arrangement (17) with respect to the electron beam source arrangement (19) may allow for distributed heat flux to the anode arrangement thereby possibly reducing cooling requirements.
Public/Granted literature
- US20120300901A1 DISTRIBUTED X-RAY SOURCE AND X-RAY IMAGING SYSTEM COMPRISING THE SAME Public/Granted day:2012-11-29
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