Invention Grant
- Patent Title: Built-in-self-test using embedded memory and processor in an application specific integrated circuit
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Application No.: US13683760Application Date: 2012-11-21
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Publication No.: US08566660B2Publication Date: 2013-10-22
- Inventor: Richard D Taylor , Mark D Montierth , Melvin D Bodily , Gary Zimmerman , John D Marshall
- Applicant: Marvell International Technology Ltd
- Applicant Address: BM Hamilton
- Assignee: Marvell International Technology Ltd
- Current Assignee: Marvell International Technology Ltd
- Current Assignee Address: BM Hamilton
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F11/00

Abstract:
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implement using a few terminals of the ASIC.
Public/Granted literature
- US20130080835A1 BUILT-IN-SELF-TEST USING EMBEDDED MEMORY AND PROCESSOR IN AN APPLICATION SPECIFIC INTERGRATED CIRCUIT Public/Granted day:2013-03-28
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