发明授权
- 专利标题： High-linearity testing stimulus signal generator
- 专利标题（中）： 高线性测试刺激信号发生器
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申请号： US13092531申请日： 2011-04-22
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公开(公告)号： US08542053B2公开(公告)日： 2013-09-24
- 发明人: Chun-Wei Lin , Yi-Cang Wu
- 申请人： Chun-Wei Lin , Yi-Cang Wu
- 申请人地址： TW Yunlin County
- 专利权人： National Yunlin University of Science and Technology
- 当前专利权人： National Yunlin University of Science and Technology
- 当前专利权人地址： TW Yunlin County
- 代理机构： Muncy, Geissler, Olds & Lowe, PLLC
- 主分类号： G06G7/12
- IPC分类号： G06G7/12
摘要：
A high-linearity testing stimulus signal generator comprises a signal collection unit receiving an input current signal, a waveform conversion unit connecting with the signal collection unit, a first voltage-to-current conversion unit connecting with the waveform conversion unit, a delay unit connecting with the waveform conversion unit, a second voltage-to-current conversion unit connecting with the delay unit, a current comparison unit connecting respectively with the first voltage-to-current conversion unit and the second voltage-to-current conversion unit, an error calculation unit connecting with the current comparison unit, and a compensation unit connecting with the error calculation unit. The above-mentioned structure forms a feedback mechanism to perform compensation adjustment to promote the linearity of the output signals. Thus, the present invention can generate high-accuracy testing stimulus signals.
公开/授权文献
- US20120268192A1 HIGH-LINEARITY TESTING STIMULUS SIGNAL GENERATOR 公开/授权日：2012-10-25
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