Invention Grant
- Patent Title: Spectral distribution measuring device
- Patent Title (中): 光谱分布测量装置
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Application No.: US12879761Application Date: 2010-09-10
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Publication No.: US08497988B2Publication Date: 2013-07-30
- Inventor: Kohei Shimbo , Manabu Seo , Naohiro Kamijo
- Applicant: Kohei Shimbo , Manabu Seo , Naohiro Kamijo
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Dickstein Shapiro LLP
- Priority: JP2009-211436 20090914
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
A spectral distribution measuring device includes an illumination unit configured to illuminate white light to a surface of an object being measured; a slit array having a plurality of slits formed in alignment at equal intervals; a linear image sensor including a light receiving face having a plurality of rectangular pixels adjacently arranged in alignment and a plurality of spectral light-irradiated areas divided in each predetermined number of neighboring pixels; a plurality of areas being measured which is set on the surface of the object being measured, and reflects the light irradiated by the illumination unit to the plurality of slits; and a diffraction unit configured to diffract and disperse reflection light which is reflected from the areas being measured and has passed through each slit, the diffraction unit being disposed such that a direction where a diffraction image expands is inclined at an angle to a direction where the light receiving face expands.
Public/Granted literature
- US20110063615A1 SPECTRAL DISTRIBUTION MEASURING DEVICE Public/Granted day:2011-03-17
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