Invention Grant
- Patent Title: Resistance measurement in high power apparatus environments
- Patent Title (中): 大功率设备环境中的电阻测量
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Application No.: US12937271Application Date: 2009-04-21
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Publication No.: US08497692B2Publication Date: 2013-07-30
- Inventor: Zoran Stanisic , Heinz Wernli , Romain Douib , Nils Wäcklen
- Applicant: Zoran Stanisic , Heinz Wernli , Romain Douib , Nils Wäcklen
- Applicant Address: SE Taby
- Assignee: Megger Sweden AB
- Current Assignee: Megger Sweden AB
- Current Assignee Address: SE Taby
- Agency: Potomac Patent Group, PLLC
- International Application: PCT/SE2009/050410 WO 20090421
- International Announcement: WO2009/131530 WO 20091029
- Main IPC: G01R27/08
- IPC: G01R27/08

Abstract:
Systems and methods can be provided for measuring the resistance of high power apparatuses. A device can include a current source connectable to a test object, and the ability for measuring current and/or voltage, wherein the current source is a capacitor. By providing the current source as a capacitor, a light weight device is obtained which can be used essentially continuously without periods of non-use during recharging.
Public/Granted literature
- US20110084715A1 Resistance Measurement in High Power Apparatus Environments Public/Granted day:2011-04-14
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