Opto-electronic signal processing systems, apparatus and methods to extract a measured parameter from one or more interrogated optical sensors are disclosed. The apparatus includes an integrated laser module, an electronic control and processing unit, an optical coupling element, and one or more light receivers. Light is reflected back from the optical sensor through the optical coupling element to the light receiver(s). The electronic control and processing unit controls the wavelength of the integrated laser module using thermal control and, at the same time, detecting the wavelength of the integrated laser module using a wavelength selective element of the integrated laser module. According to the method, a wavelength sweep from the integrated laser module wavelength is swept, simultaneously measured and stored in memory of the electronic control and processing unit. The optical sensor response is recorded during the sweep and combined with stored emitted wavelengths to obtain spectral characteristics of interrogated optical sensor. Numerous other aspects are provided.