- 专利标题: Integrated surgical microscope and wavefront sensor
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申请号: US13619168申请日: 2012-09-14
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公开(公告)号: US08475439B2公开(公告)日: 2013-07-02
- 发明人: Anthony Y. Van Heugten , Daniel S. Durrie
- 申请人: Anthony Y. Van Heugten , Daniel S. Durrie
- 申请人地址: US CA Aliso Viejo
- 专利权人: WaveTec Vision Systems, Inc.
- 当前专利权人: WaveTec Vision Systems, Inc.
- 当前专利权人地址: US CA Aliso Viejo
- 代理机构: Knobbe, Martens, Olson and Bear, LLP
- 主分类号: A61B18/18
- IPC分类号: A61B18/18
摘要:
A wavefront sensor is integrated with a surgical microscope for allowing a doctor to make repeated wavefront measurements of a patient's eye while the patient remains on an operating table in the surgical position. The device includes a wavefront sensor optically aligned with a surgical microscope such that their fields of view at least partially overlap. The inclusion of lightweight, compact diffractive optical components in the wavefront sensor allows the integrated device to be supported on a balancing mechanism above a patient's head during a surgical procedure. As a result, the need to reposition the device and/or the patient between measuring optical properties of the eye and performing surgical procedures on the eye is eliminated. Many surgical procedures may be improved or enhanced using the integrated device, including but not limited to cataract surgery, Conductive Keratoplasty, Lasik surgery, and corneal corrective surgery.
公开/授权文献
- US20130021574A1 INTEGRATED SURGICAL MICROSCOPE AND WAVEFRONT SENSOR 公开/授权日:2013-01-24
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