发明授权
US08475042B1 Thermal shield system for high temperature environment XRF metrology tools 有权
用于高温环境XRF计量工具的热屏蔽系统

  • 专利标题: Thermal shield system for high temperature environment XRF metrology tools
  • 专利标题(中): 用于高温环境XRF计量工具的热屏蔽系统
  • 申请号: US12925366
    申请日: 2010-10-20
  • 公开(公告)号: US08475042B1
    公开(公告)日: 2013-07-02
  • 发明人: Francis Reilly
  • 申请人: Francis Reilly
  • 申请人地址: US NY Saugerties
  • 专利权人: Ceres Technologies, Inc.
  • 当前专利权人: Ceres Technologies, Inc.
  • 当前专利权人地址: US NY Saugerties
  • 主分类号: H05G1/00
  • IPC分类号: H05G1/00
Thermal shield system for high temperature environment XRF metrology tools
摘要:
A thermal shield for an XRF measurement tool is formed from a heat shield and a heat shield cowling. These components protect the X-ray head assembly that includes the x-ray generation and detection columns and the head control electronics, communications and cooling systems. The heat shield is directly below the X-ray head, parallel to the x-ray head plane and plane of the PV substrate, and perpendicular to the primary beam output from the x-ray head. The heat shield is fabricated of machined copper with several ports machined through the shield. These ports provide a path for primary beam x-rays through the heat shield and for the return of fluoresced X-rays from the PV substrate back to the detector in the X-ray head, while preventing damage to the X-ray head due to the heat emitted from the PV substrate.
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