发明授权
US08475042B1 Thermal shield system for high temperature environment XRF metrology tools
有权
用于高温环境XRF计量工具的热屏蔽系统
- 专利标题: Thermal shield system for high temperature environment XRF metrology tools
- 专利标题(中): 用于高温环境XRF计量工具的热屏蔽系统
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申请号: US12925366申请日: 2010-10-20
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公开(公告)号: US08475042B1公开(公告)日: 2013-07-02
- 发明人: Francis Reilly
- 申请人: Francis Reilly
- 申请人地址: US NY Saugerties
- 专利权人: Ceres Technologies, Inc.
- 当前专利权人: Ceres Technologies, Inc.
- 当前专利权人地址: US NY Saugerties
- 主分类号: H05G1/00
- IPC分类号: H05G1/00
摘要:
A thermal shield for an XRF measurement tool is formed from a heat shield and a heat shield cowling. These components protect the X-ray head assembly that includes the x-ray generation and detection columns and the head control electronics, communications and cooling systems. The heat shield is directly below the X-ray head, parallel to the x-ray head plane and plane of the PV substrate, and perpendicular to the primary beam output from the x-ray head. The heat shield is fabricated of machined copper with several ports machined through the shield. These ports provide a path for primary beam x-rays through the heat shield and for the return of fluoresced X-rays from the PV substrate back to the detector in the X-ray head, while preventing damage to the X-ray head due to the heat emitted from the PV substrate.
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