发明授权
US08384395B2 Circuit for controlling temperature and enabling testing of a semiconductor chip
有权
用于控制温度的电路，并能够测试半导体芯片
- 专利标题： Circuit for controlling temperature and enabling testing of a semiconductor chip
- 专利标题（中）： 用于控制温度的电路，并能够测试半导体芯片
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申请号： US12774730申请日： 2010-05-06
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公开(公告)号： US08384395B2公开(公告)日： 2013-02-26
- 发明人: Ravindra Karnad , Sudheer Prasad , Ram A Jonnavithula
- 申请人： Ravindra Karnad , Sudheer Prasad , Ram A Jonnavithula
- 申请人地址： US TX Dallas
- 专利权人： Texas Instrument Incorporated
- 当前专利权人： Texas Instrument Incorporated
- 当前专利权人地址： US TX Dallas
- 代理商 Robert D. Marshall, Jr.; Wade James Brady, III; Frederick J. Telecky, Jr.
- 主分类号： H01H31/02
- IPC分类号： H01H31/02
摘要：
A circuit for controlling temperature of a semiconductor chip includes a first heating element that is built into the semiconductor chip. The first heating element generates heat to increase the temperature of the semiconductor chip. The chip also includes a temperature controller that is coupled to the first heating element and built into the semiconductor chip. The temperature controller controls the temperature to enable testing of the semiconductor chip at a desired temperature.
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