Invention Grant
US08374309B2 Arrangement and method for projective and/or tomographic phase-contrast imaging using X-ray radiation
有权
使用X射线辐射的投影和/或断层扫描相位对比成像的布置和方法
- Patent Title: Arrangement and method for projective and/or tomographic phase-contrast imaging using X-ray radiation
- Patent Title (中): 使用X射线辐射的投影和/或断层扫描相位对比成像的布置和方法
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Application No.: US12686404Application Date: 2010-01-13
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Publication No.: US08374309B2Publication Date: 2013-02-12
- Inventor: Tilman Donath , Martin Hoheisel , Christian David , Eckhard Hempel , Franz Pfeiffer , Stefan Popescu
- Applicant: Tilman Donath , Martin Hoheisel , Christian David , Eckhard Hempel , Franz Pfeiffer , Stefan Popescu
- Applicant Address: DE Munich CH Villigen, PSI
- Assignee: Siemens Aktiengesellschaft,Paul Scherrer Institut
- Current Assignee: Siemens Aktiengesellschaft,Paul Scherrer Institut
- Current Assignee Address: DE Munich CH Villigen, PSI
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102009004702 20090115
- Main IPC: H05G1/64
- IPC: H05G1/64 ; A61B6/03 ; G01N23/083 ; G21K1/00 ; G21K3/00

Abstract:
An arrangement and a method are disclosed for projective and/or tomographic phase-contrast imaging using X-ray radiation. In at least one embodiment, one or more phase grids is/are arranged in the beam path such that during a rotation of the at least one X-ray source, the examination object is scanned with different spatial orientations of the grid lines relative to the examination object such that the complete refraction angle, and hence the complete phase shift gradient, can be determined for each X-ray beam from the two scans with differently oriented phase grids in order to be able to show the phase shift of an examination object in terms of projections or in a tomographic image.
Public/Granted literature
- US20100177864A1 ARRANGEMENT AND METHOD FOR PROJECTIVE AND/OR TOMOGRAPHIC PHASE-CONTRAST IMAGING USING X-RAY RADIATION Public/Granted day:2010-07-15
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