发明授权
- 专利标题: Atom-interferometric, stepped gravity gradient measuring system
- 专利标题(中): 原子干涉仪,阶梯式重力梯度测量系统
-
申请号: US12210852申请日: 2008-09-15
-
公开(公告)号: US08347711B2公开(公告)日: 2013-01-08
- 发明人: Hugh F. Rice , Jack C. Lindell , Daniel J. DiFrancesco
- 申请人: Hugh F. Rice , Jack C. Lindell , Daniel J. DiFrancesco
- 申请人地址: US MD Bethesda
- 专利权人: Lockheed Martin Corporation
- 当前专利权人: Lockheed Martin Corporation
- 当前专利权人地址: US MD Bethesda
- 代理机构: Kaplan, Breyer, Schwarz & Ottesen, LLP
- 主分类号: G01V7/00
- IPC分类号: G01V7/00
摘要:
A full-tensor, gravity gradient measuring system is disclosed that is based on atom interferometry. Each axis in the three-axis measuring system is served by a different gravity gradiometer, where each gradiometer comprises three pairs of atom interferometric (AI) accelerometers. The accelerometers in each pair are mounted on opposite sides of the gradiometer's rotation axis from each other. The three AI accelerometer pairs are step-rotated, instead of being continuously rotated, thereby providing enhanced signal-to-noise performance. The three gradiometers in the overall measuring system are mounted orthogonally with respect to one another on a local-level platform, in order to achieve a full-tensor measuring system. The measuring system can be step-rotated as an overall unit around an axis perpendicular to a local level reference. The multiple levels of stepped rotation, as enabled by the atom interferometry being utilized, yields improved results with lower costs than what is achievable with some prior-art techniques.
公开/授权文献
信息查询